The XZR400 Series analyzers detect traces (low concentrations) of oxygen in pure gases and are used in the production of industrial gases, in laboratories, during welding and when filling cylinders.
The main application is the determination of concentrations of less than 4 ppm O2 in nitrogen, argon, helium, carbon dioxide and other inert and pure gases. The fast response provided by MSRS technology allows you to quickly detect leaks and prevent contamination in the production of silicon wafers, and a low sample flow rate (1-3 Nl / h) is ideal for measurements in expensive gases such as krypton and xenon.